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FEATURES ・ Absolute quantum yield measurement of luminous materials by PL method ・ Instant measurement with employing a high sensitivity CCD sensor ・ Stable measurement using a stable xenon light source ・ Various wavelengths measurement from UV to NIR ・ Free from the variance of the emission radiation pattern using an integral sphere ・ Optional electro-luminescence efficiency measurement using a power source meter ・ Adaptable to various samples, such as thin films, solutions and powders
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APPLICATIONS ・ Fundamental research on photo-luminescence in the field of physics, chemistry etc. - Fluorescence quantum yield - Phosphorescence quantum yield - Other PL quantum yield ・ Measurement of PL quantum yield for photo-luminescent materials - Organic LED (fluorescent/phosphorescent) materials - Fluorescent probes - Quantum dots ・ Measurement of internal quantum efficiency for fluorescent materials - Inorganic LED materials - Fluorescent materials for white light LED - Fluorescent materials for flat panel displays (plasma display, field emission display etc.)
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