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In response to the increased speed of CPU’s and the requirements for reduced power consumption in mobile devices, advanced ICs have undergone a lowering of voltage, conversion to flip chips, multi-layering and further size reductions. Consequently it has become difficult to analyze the timing of internal operations with conventional techniques.
The TriPHEMOS tool proves a non-contact method for analizing circuit timing by detecting the faint light generated when CMOS transistors operate using a two-dimensional infrared detector, allowing analysis of device timing with picosecond precision.
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