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When the beam from a semiconductor laser is focused through a lens or conducted through a fiber or similar element, it is important to have a clear understanding of the FFP (Far Field Pattern) of the semiconductor laser. Conventionally, FFP measurement of semiconductor lasers was usually done by scanning the photodiodes around the beam, but there were a number of problems with this method: it was only possible to obtain linear data, it was time-consuming, and it was not possible to measure pulse light.
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