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Products > Optical Measurement System > Optical Characteristics Evaluation > External Quantum Efficiency Measurement > External Quantum Efficiency Measurement System


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External Quantum Efficiency Measurement System


C9920-12


External Quantum Efficiency Measurement System

The C9920-12 External Quantum Efficiency Measurement System is a system for measuring the external quantum efficiency of a light emitting device such as organic/inorganic LED and LED by electro-luminescence(EL) method.
The luminous efficiency of light emitting devices is related to various elements, such as the absorption of the light emitting part and glass substrate, and the efficiency of the reflective mirror surface, so on. The C9920-12 can measure the efficiency of external emissions for
the applied current (voltage), inclusive of these elements related to efficiency.
The current (voltage) applied to the sample can be set on the software. It is applied to the sample in steps from the minimum value to the maximum value for the current (voltage) set in advance from a power source meter. With an integrating sphere, highly precise emission efficiency measurements can be made independently of the
emission angle distribution characteristics.


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=FEATURES
・  With  an  integrating  sphere  the  measurement  does  not  influenced  on  the  emission  angle  characteristics  of  the  sample
・  The  power  source  meter  (KEITHLEY  2400)  can  be  controlled  on  the  software
・  The  spectrum  can  be  measured  instantaneously  with  Hamamatsu  spectrometer  for  each  step  of  the  applied  current  (voltage)
・  Using  a  high-performance,  BT(buck  thinned)  cooled  CCD  ,the  system  has  ultra-high  sensitivity
・  Settings,  measurements  and  displays  of  results  are  simplified  by  the  dedicated  software
・  On  the  software,  it  is  possible  to  display  various  types  of  graphs,  such  as  current/current  density/voltage-spectrum,  current/current  density/luminous  efficiency  or  current/current  density/voltage-color  coordinates.
・  The  system  can  be  easily  extended  to  quantum  yield  measurements  and  brightness  and  light  distribution  characteristics  with  additional  parts
SPECIFICATIONS
・  Integrating  sphere  :  3.3  inch  inside  diameter,  reflective  material:  Spectralon
・  Detector  :  BT(buck  thinned)  cooled  CCD
・  Cooling  temperature  :  -15  deg.C
・  No.  of  photosensitive  device  channels  :  1024  ch
・  Wavelength  measurement  range  :  380  nm  to  780  nm  (detector:  200  nm  to  950  nm)
・  Fiber  :  1.5  m
・  Range  of  measurement  for  luminous  flux  :  0.00013  lm  to  0.12  lm  (with  an  emission  area  2  mm  square  and  white  light)



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