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FEATURES ・ Easy operation using Windows 2000/XP ・ Real-time display of beam parameters ・ High resolution display ・ High resolution image acquisition ・ Image equalization function ・ External trigger function ・ Dark subtraction function ・ Specifying the analysis region to match the beam ・ Multiple camera inputs
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APPLICATIONS ・ Semiconductor Laser FFP Measurement System ・ Fiber NA measurement system ・ Semiconductor Laser NFP Measurement System ・ Measuring Astigmatic Differences System ・ Optical pickup measurement system ・ Infrared Laser NFP Measurement System etc.
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