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Products > Division > Systems Division > Semiconductor / FPD Analysis > Failure Analysis Support > Failure Analysis Support System: FA-Navigation


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Failure Analysis Support System: FA-Navigation



Failure Analysis Support System: FA-Navigation

FA-Navigation is a Windows based failure analysis support software.Localizing the actual physical failure site indicated by multiple photoemission sites with high spatial resolution typically requires a great deal of time and effort. FA-Navigation uses CAD data to effectively narrow down failure locations, and as it operates on a Windows platform and can run on a personal computer, the turnaround time (TAT) for failure analysis is reduced.


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FEATURES
・  Extraction  of  the  NETs  passing  through  a  region  by  setting  signal  locations  (photoemission,  OBIRCH  and/or  thermal  emission  signatures)  as  ROIs.
・  The  extracted  NETs  are  sorted  according  to  the  number  of  regions  they  pass  through,  making  it  easier  to  narrow  down  the  NETs  responsible  for  the  detected  signal.
・  By  seamlessly  integrating  failure  analysis  signal  data  for  multiple  sources  with  CAD  information,  FA-Navigation  rapidly  narrows  down  the  selection  of  candidate  failure  sites  with  high  precision.
・  Three  images,  the  data  image  (photoemission,  OBIRCH  and/or  thermal  data  from  DUT),  the  pattern  image  and  CAD  layout  image,  are  superimposed  and  displayed  as  a  single  image.



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