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Products > Division > Systems Division > Semiconductor / FPD Analysis > Failure Analysis > Thermal Emission Microscope

Failure Analysis

Inverted Emission Microscope

Pico-second Time-resolved Emission Microscope

Emission Microscope

Thermal Emission Microscope

Thermal Emission Microscope

THEMOS-1000

This is a system for analyzing semiconductor failures through the detection and localization of the thermal signal generated within semiconductor devices.

THEMOS mini

This is thermal emission microscope with a high-sensitivity InSb camera that detects internal heat emissions from a semiconductor device.

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