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FEATURES ・High resolution / high sensitivity (Horizontal spatial resolution with 128(V) TDI stages) - 4096(H) x 128 (V) TDI stages, 16TAP or 8TAP ・ Line rates up to 100 kHz (C10000-701, 16TAP with 30MHz pixel clock) ・ High speed imaging combined with high sensitivity and low noise ・ Great spectra response for UV-NIR with Back thinned CCD ・ 100 % fill factor ・ 100x anti-blooming with lateral overflow drain ・ Dynamic range of 770:1 ・ 12 bit / 8 bit selectable A/D converter ・ Bi-directional scanning operation ・ Frame readout mode for easy focusing ・ Internal real-time shading correction
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APPLICATIONS ・ High speed imaging for low light applications (i.e. Fluorescence imaging) ・ Semiconductor inspection ・ Electronics manufacturing and inspection ・ High speed scanning for a large size sample (i.e. Flat panel displays)
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