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FEATURES ・ Horizontal spatial resolution with 128(V)TDI stages - 2048(H) x 128 (V) TDI stages, 4TAP - 1024(H) x 128 (V) TDI stages, 2TAP ・ Line rates up to 50 kHz ・ High speed imaging combined with high sensitivity and low noise ・ Great spectra response for UV-NIR with Back thinned CCD ・ 100 % fill factor ・ 100x anti-blooming with lateral overflow drain ・ Dynamic range of 770:1 ・ 12 bit / 8 bit selectable A/D converter ・ Bi-directional scanning operation ・ Frame readout mode for easy focusing ・ Internal real-time shading correction
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APPLICATIONS ・ High speed imaging for low light applications (i.e. Fluorescence imaging) ・ Semiconductor inspection ・ Electronics manufacturing and inspection ・ High speed scanning for a large size sample (i.e. Flat panel displays)
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