Semiconductor Failure Analysis and Product Support

This is an imaging and analysis system that picks up light emissions, heat generation and electrical changes due to abnormal phenomena that occur inside semiconductor devices.

Complimenting our line of high performance failure analysis tool and detector hardware, Hamamatsu introduces a new software tool for enhance FA productivity.

The inside of semiconductor devices is observed using infrared illumination, which passes through silicon, and a camera with sensitivity to the near infrared range.

In Stealth Dicing, a laser beam at a wavelength capable of transmitting through the material is condensed on an internal point in that material.

The Photoionizer is a completely new type of electrostatic remover using "photoionization" for clean, easy, yet effective generation of ions.