A world first: New "TriPHEMOS picosecond time-resolved imaging emission microscope" conducts 2D dynamic analysis at low-voltage cutting-edge LSI action timing

November. 2004.

Hamamatsu Photonics has added a new product to its lineup of the PHEMOS series of emission microscopes, used for failure analysis of semiconductor devices. The new product, the Tri-PHEMOS time-resolved imaging emission microscope, is the first in the world to dynamically analyze the action timing of cutting-edge LSIs with low voltage, using two-dimensional images. The company will begin taking orders for the product on January 20, 2004.