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Exhibition Calender

ここから本文です
Table of Exhibitions

Schedule
Exhibition name
Venue
Items planned for display
Apr 8-11,
2008
Nepcon China

Shanghai
Everbright
Convention &
Exhibition Centre,
Shanghai, China
Microfocus X-ray Source
Photoionizer
Spot Light Source
Apr 16-18,
2008
FPD R&D AND MANUFACTURING TECHNOLOGY EXPO
& CONFERENCE

(FINETECH JAPAN)

Tokyo Big Sight,
Tokyo, Japan
Photoionizer
Spot Light Source
UV Power Meter
AP Imager Camera
Absolute PL Quantum Yield Measurement System
Optical Thickness Measurement System
Photonic Multichannel Analyzer
Organic LED Defects Repair System
Thermal Emission Microscope
Multiband Plasma-Process Monitor
Mini-Spectrometers
Color Sensors
Illuminance Sensors
Apr 18-21,
2008
CMEF 2008 Spring
(China International Medical Equipment Fair)

Chengdu New International Convention & Exhibition Center, Chengdu, China
X-ray Scintillator ACS/ ALS/ FOS
Jun 11-13,
2008
JPCA Show 2008
(International Electronic Circuits Exhibition)

Tokyo Big Sight,
Tokyo, Japan
Microfocus X-ray Source
X-ray TDI Camera
X-ray Line Scan Camera
X-I.I. Camera Unit
Jul 23-25,
2008
AT International 2008

Makuhari Messe, Chiba, Japan
Automotive Devices
Jul 30-Aug 1,
2008
Micromachine / MEMS

Tokyo Big Sight,
Tokyo, Japan
Stealth Dicing Technology
Sep 3-5,
2008
JAIMA SHOW 2008
(Japan Analytical Instruments Manufacturers Association)

Makuhari Messe, Chiba, Japan
Photomultiplier Tubes
MCP Assembly
UV-VIS Fiber Light Source
Mini-Spectrometer
Opto-semiconductors
Sep 10-12,
2008
InterOpto '08

Makuhari Messe, Chiba, Japan
Opto-semiconductors
Photonic Multichannel Analyzer
Laser Beam Profiler
Measurement System for Organic LED Materials
Sep 30-Oct 4,
2008
Ceatec Japan 2008

Makuhari Messe, Chiba, Japan
Opto-semiconductors
Oct 29-31,
2008
FPD International 2008

Pacifico Yokohama, Yokohama, Japan
Absolute PL Quantum Yield Measurement System
Optical Thickness Measurement System
Photonic Multichannel Analyzer
Organic LED Defect Repair System
Thermal Emission Microscope

Revised : Apr 9, 2008



*Please note that the products we plan to display may change or be withdrawn in some cases.




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